Unraveling Current-Bias-Induced Transition Discrepancy in Transition-Edge Sensors in
<i>R-T</i>
Tests and Establishing a Reliable Characterizing Method
Authors: Qing Yu, Yongping Li, Guanhua Gao et al.
Publication: IEEE Transactions on Applied Superconductivity
Published: Oct 1, 2026
Source: Crossref