Correlative transmission electron microscopy and time-of-flight secondary ion mass spectrometry analysis of MnBi₂Te₄ superlattices in Mn-doped Bi₂Te₃ topological insulators
Authors: Kamil Sobczak, Jakub Wiśniewski, Agnieszka Wołoś
Publication: Surfaces and Interfaces
Published: Apr 1, 2026
Source: Crossref